教學傑出教師專區

Conferences

  • Design Automation Conference (DAC)
  • International Conference on Computer-Aided Design (ICCAD)
  • Design, Automation & Test in Europe (DATE)
  • International Conference on Computer Design (ICCD)
  • International Test Conference (ITC)
  • IEEE VLSI Test Symposium (VTS)
  • International High Level Design Validation and Test Workshop (HLDVT)
  • The International Symposium on Quality Electronic Design (ISQED)
  • The International HDL Conference
  • Asia South Pacific Design Automation Conference (ASP-DAC)
  • ISCAS 2000
  • ATS 2000

    • Academical Sites

  • Institute for Scientific Information (ISI)
  • IEEE Home Page
  • IEEE Xplore
  • IEEE Circuits and Systems Society
  • IEEE Computer Society
  • IEEE Design & Test of Computers
  • IEEE Transactions on Computer-Aided Design
  • IEEE Transactions on VLSI Systems
  • ACM Home Page
  • ACM Digital Library
  • ACM TODAES
  • ACM SIGDA Home Page
  • IEE Home Page
  • IEICE Home Page
  • Journal of Information Science and Engineering (JISE)

    • Other Research Labs

  • UC Berkeley Design Technology Warehouse
  • NTU EDA Lab (Prof. Yao-Wen Chang, NTU)
  • NCTU EDA Lab (Prof. Jing-Yang Jou, NCTU)
  • Laboratory for Reliable Computing (Cheng-Wen Wu, NTHU)
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